Si 上に作製した Co<sub>2</sub>FeAl<sub>0.5</sub>Si<sub>0.5</sub> フルホイスラー合金薄膜の結晶構造とスピン伝導特性

Abstract

We investigated the crystal structure and spin conduction property of Co2FeAl0.5Si0.5 (CFAS) full-Heusler alloy thin films deposited on Si substrate. The multilayer films with different barrier layer were deposited by RF magnetron sputtering system to compare their spin conduction properties. Spin injection signals were observed only with Si sub.//Mg/MgO/CFAS structure. It is considered that the crystal structure near the interface changed by insertion of Mg layer affected the spin conduction property.