Abstract
The scanning hot electron microscope (SHEM) is a tool to observe non-thermal- equilibrium electrons under the surface of a solid, and it enables us to study the hot electron diffraction pattern caused by a small structure in the propagation layer. To observe the hot electron spatial distribution by SHEM, the detection time must be shortened. The reduction of the noise current including vibrational noise is investigated comprehensively. By the reduction of noise, in particular, that of nonstationary noise with digital measurements, the hot electron current was detected in 30 s, 1/20 of the measurement time reported previously.
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