Abstract
In studies using piezoresponse force microscopy, we observe a nonzero lateral piezoresponse at 180° domain walls in out-of-plane polarized, c-axis-oriented tetragonal ferroelectric Pb(Zr0.2Ti0.8)O3 epitaxial thin films. We attribute these observations to a shear strain effect linked to the sign change of the d33 piezoelectric coefficient through the domain wall, in agreement with theoretical predictions. We show that in monoclinically distorted tetragonal BiFeO3 films, this effect is superimposed on the lateral piezoresponse due to actual in-plane polarization and has to be taken into account in order to correctly interpret the ferroelectric domain configuration.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.