Abstract
SUMMARYPlant growth analysis, demographic analysis and yield component analysis are three procedures used to study relationships underlying plant growth and development. Previously, it has been shown that demographic analysis is qualitatively different from plant growth analysis. This paper demonstrates how plant growth analysis and yield component analysis can be merged into a composite procedure, sequential plant growth analysis. The composite approach treats some of the traditional indices of plant growth, including leaf area ratio, leaf area index, unit leaf rate, relative growth rate, crop growth rate and harvest index, as yield components. Regression analysis is used to assess quantitatively the contributions of individual yield components to variations in growth and yield. Fitted curves and trends in coefficients of determination are both used to follow the time course of relationships during development. A study of vegetative growth in bean plants is used to illustrate the composite procedure.
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