Abstract

Polycrystalline ceramic samples of BiFe1−xZnxO3 (x = 0.00 and 0.05) have been prepared by sol–gel synthesis method. The formation of the compound has been checked by the X-ray analysis and confirmed the observed data by matching with the standard data (ICSD-97591). The Rietveld analysis confirmed the rhombohedral symmetry with space group R3c. The average crystallite size calculated by the Scherrer method is well matching with that calculated by Williamson–Hall plot method and is of the order of nanometre range. The two- and three-dimensional surface morphology has been measured using atomic force microscopy. The dielectric parameters, including dielectric constant, impedance, etc., have been measured and explained using the universal dielectric response model. The electrical modulus study explains the transport behaviour of the materials. The activation energies calculated by the dc conductivity measurement and the I–V characteristics indicate that both the materials show semiconducting behaviour. Thermal analysis has been used to check the high temperature phase transition and thermal stability of the materials. The room temperature FTIR spectra measured in the fingerprint region (750 cm−1 to 400 cm−1) explains the molecular symmetry of the materials. All the results have been discussed in detail.

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