Abstract
The importance of the electrostatic discharge when a particular type of laser structure is chosen for optical communication equipment is considered. Electrostatic performance tests of low-cost InGaAsP laser diodes are reported and a comparison is made between the different structures. Failure analysis was performed with a scanning optical microscope and a scanning electron microscope. The results of failure analysis are correlated with electrooptical recordings. The performance of the D2Scan algorithm, which gives the position of a defect within the active stripe of a laser from a spectrum measurement, is also qualitatively studied. Finally, the importance of the screening rules for these devices is emphasized.
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