Abstract
The study of electromagnetic (EM) field sensitivities is useful for assessing the feasibility of controlled-source electromagnetic (CSEM) surveys. Sensitivity calculations are also a principal building block of EM inversion schemes. Sensitivities are formally given by the derivatives of the EM field components with respect to conductivity. For horizontally layered media, these derivatives can be evaluated analytically, offering advantages in computational efficiency and accuracy over numerical evaluation. We present a complete set of explicit analytic expressions for the EM field sensitivities in 1-D VTI-anisotropic media for horizontal and vertical electric and magnetic dipole sources, and also for finite horizontal electric sources. Since our derivations are based on a formulation for EM fields that is quite general in allowing for sources and receivers at any depth, our sensitivity expressions exhibit the same generality. We verify our expressions by comparison to numerical solutions, and finally present application examples that demonstrate the utility and versatility of these expressions for CSEM feasibility studies.
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