Abstract
Electrical properties of semiconductor surfaces can be determined by measuring the transverse acoustoelectric voltage. This voltage is produced by the interaction of the surface acoustic wave propagating on a piezoelectric substrate and the carriers on semiconductor surface placed in proximity. Using 110 MHz LiNbO 3 delay lines, the transverse acoustoelectric voltage has been measured across CdS and Si, the surface properties of which are varied by different light illumination. Detailed study of the voltage waveform reveals the type of traps and the amount of charge in the traps. The method is simple, needs no contacts to the sample, and is sensitive.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
