Abstract
In this paper, a review of the state-of-the-art in semiconductor laser diode reliability is presented, with a particular regard to the reliability of laser diodes used in long-distance telecommunication system. Remarkable advances in semiconductor laser reliability have been demonstrated over their thirty year history, leading to estimated median device lifetimes in excess of 100 years for most applications.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have