Abstract
Two methods for determining semiconductor laser linewidth using the transmission-line laser model (TLLM) are developed. The first is a semianalytical method suitable for DFB lasers. The second uses Fourier transforms to extract the laser spectrum from the simulated optical field, and is suitable for any laser structure. A technique for increasing the accuracy of this second method has been developed. Extensive comparisons with previous work verify the accuracy of both methods.
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