Abstract
Graphene oxide (GO) is prepared as a self-supporting thin film by a liquid solution of GO. The so-obtained GO films have been characterized in terms of thickness and density. The GO film composition and trace elements have been measured with Rutherford backscattering spectrometry (RBS) and Elastic recoil detection analysis (ERDA), using MeV helium ion beams. The presence of crystalline and amorphous phases has been also investigated with X-ray diffraction (XRD) and the morphology by scanning electron microscopy (SEM). Information about the GO film structure, oxidation degree and thickness has been deduced by means of Fourier transform infrared spectroscopy (FT-IR), Raman and optical spectroscopy (ultraviolet-visible-near infrared spectroscopy, UV-Vis-nIR). In particular, the GO film thickness varies from sub-micrometric values up to micrometric ones. Furthermore, the GO film heating in air up to 60 °C produces oxidation effects as deduced from the interpretation of our data.
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