Abstract
The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port network analysis. The extracted short thermal time constant confirms the thermal stability for this emerging technology. A lumped-element electro-thermal model for multi-tube CNTFETs has been developed and proven with experimental data.
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