Abstract
Laser-induced damage thresholds (LIDTs) of input/exit surfaces and filamentation of fused silica under low-temporal coherence light (LTCL) and a corresponding damage mechanism are investigated. By comparing self-focusing effects of fused silica for each incident laser, the lower LIDT of filamentation damage under LTCL irradiation is mainly attributed to stronger self-focusing than traditional single longitudinal mode (SLM) pulse lasers. Meanwhile, differences in LIDTs for input/exit surfaces by LTCL and SLM pulse laser irradiation are attributed to self-focusing effects and backward stimulated Brillouin scattering. Finally, influences of fused silica thickness and incident laser polarization on LIDT are demonstrated. The research contributes to exploring safe boundaries for fused silica application in high-power LTCL devices.
Published Version
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