Abstract
The observation of surface phonon using scanning probe microscopy can provide important information related to local structural and electrical properties. In this study, surface phonon modes on a Cu(100) surface were measured using inelastic tunneling spectroscopy of scanning tunneling microscopy. One phonon mode was measured at 3.6 meV on a clean Cu(100) surface. On an oxygen-adsorbed Cu(100) surface, another phonon mode was measured at 13.5 meV. This phonon mode was considered to be enhanced by the symmetry created by Cu-missing rows. The spatially varying d2I/dV2 map showed the effect of surface stress relaxation.
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