Abstract
The successive approximation register (SAR) ADCs suffer from capacitor mismatch when considered for high-precision applications. Recently, a mismatch error shaping (MES) technique suitable for SAR ADCs has been proposed, by which the DAC mismatch error is first-order highpass shaped. The MES technique to the second-order is generalised. A concrete implementation of the second-order MES is presented. Theoretical analysis and simulations verify the feasibility and validity of the proposed technique. Compared to the previous one, the proposed second-order MES shows significantly improved shaping effect.
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