Abstract
AbstractPositive secondary ion emission from anionic surfactant films on a gold substrate was mass spectrometrically studied under O2+bombardment. Signals from organic origin appear to be very sensitive to small variations in experimental parameters. The production of secondary metal ions (Na+, Mg+, K+, Ca+) is, however, quite reproducible. Their relative intensities drop exponentially with the first ionisation potential of the corresponding elements, yielding a so‐called plasma temperature in the range of 6500 to 8000 K. This suggests that the mechanism of secondary ion emission from adsorbed surfactants is essentially the same as for entirely different matrices. SIMS easily allows the detection of 10−14 g of adsorbed anionic surfactant via the metal counter ion.
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