Abstract
The scintillation timing characteristics of (La,Gd)2Si2O7:Ce (GPSLa23.5%:Ce) single crystal were studied and compared with Gd2SiO5:Ce (GSO:Ce) single crystal. The photoelectron yield, scintillation decay times and coincidence time resolution were measured. At 511 keV γ-rays, the photoelectron yield of 10,770 ± 500 phe MeV−1 and energy resolution of 5.4 ± 0.2% obtained for GPSLa23.5%:Ce are much better than those of 3350 ± 160 phe MeV−1 and 7.8 ± 0.3% obtained for GSO:Ce. The scintillation decay time profile was measured by the time-correlated single photon counting technique using a fast-slow coincidence setup. In both materials the comparable rise times of several nanoseconds are present. The fast component decay time of 56 ns with relative intensity of 49% obtained for GPSLa23.5%:Ce is inferior to that of 32 ns(88%) obtained for GSO:Ce. Consequently, the coincidence time resolution of GPSLa23.5%:Ce is slightly worse than that of GSO:Ce. The normalized time resolution was also discussed in terms of a number of photoelectrons and decay time of the scintillation pulse.
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