Abstract
We present calculations of surface reflectivity and emission spectra for multilayer dielectric waveguides with a two-dimensional patterning of deep holes. The spectra are obtained using a scattering-matrix treatment to propagate electromagnetic waves through the structure. This treatment incorporates, in a natural way, the extended boundary conditions necessary to describe external reflection and emission processes. The calculated spectra demonstrate how such measurements can be used to obtain experimental information about the waveguide photonic band structure, the coupling of scattering modes to external fields, and the field distribution within the waveguide.
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