Abstract
Abstract Crystal growth can be studied by the observation of growth phenomena on the surfaces of these crystals. Using optical microscopy these phenomena can be examined both ex situ and in situ. Despite the high vertical resolution (~10 A) of some of these techniques (e.g. differential interference contrast microscopy) their lateral resolution is still poor (~ 1 μ). As a consequence it is possible to detect rather low growth steps, but not their shape. In order to obtain also a higher lateral resolution scanning tunneling microscopy (STM) was used on electrolytically grown Ag(100) single crystals. First as-grown surfaces were studied with an STM operating at atmospheric conditions. Second a new STM is described with which it is possible to operate in an electrochemical system (in situ STM). Some first results of this microscope are shown and related to optical microscopical observations.
Published Version
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