Abstract
Abstract Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) have the potential of giving the three dimensional morphology of polymer surfaces with atomic resolution. We have imaged doped and undoped polyacetylene, poly(3-hexylthiophene), and polystyrene. Both these techniques are well suited to study the fibrillar nature and growth of these films. STM shows that the fibrils of the free side of iodine doped polystyrene are flat to within less that 10 Å. The fluctuations in the surface conductivity of polyacetylene and the thermally induced motion of the polymer side groups limit the potential of these techniques to give atomic resolution.
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