Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Conducting Polymer Films

Abstract

The techniques of scanning tunneling microscopy, tunneling spectroscopy, and atomic force microscopy have been used to study the nanometer-scale morphology of conducting polymer films. Scanning tunneling microscopy and atomic force microscopy allow for images to be obtained with molecular or atomic resolution on these surfaces. The technique of tunneling spectroscopy allows for the study of the local electronic structure on surfaces. In this report, we have investigated the surface structure of aniline, hydroxyaniline and borate functionalized aniline thin films.