Abstract

The smooth Coulomb blockade (CB) I–V curve is sometimes observed in cryogenic scanning tunneling microscopy using a voltage biased tip to scan a metal film. Our experiments always give some evidence of the Coulomb staircase, characteristic of two tunnel capacitors in series (STM tip, small particle, and substrate) accompanying the smooth CB I–V curves. We suggest that a small (100 Å) particle occasionally encountered between tip and surface, providing a capacitance of order 10 -18 F unaffected by voltage biased leads, is the origin of both effects.

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