Abstract
From the study of performance of scanning slit X-ray radiography, the following results were obtained. (1) It is confirmed that, by choosing proper width of electronic slit on 2-dimensional detector, effect of scattered radiation can be almost removed. (2) With the narrower incident beam and the narrower electronic slit width, the more the contrast increases. (3)Stripe like artifact appearing on the case of narrow slit width can be removed by interpolation processing. (4) From the PSF (point spread function) calculated by Monte Carlo simulation, scatter rejection performance parameters were calculated.
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