Abstract
From the study of performance of scanning slit X-ray radiography, the following results were obtained. (1) It is confirmed that, by choosing proper width of electronic slit on 2-dimensional detector, effect of scattered radiation can be almost removed. (2) With the narrower incident beam and the narrower electronic slit width, the more the contrast increases. (3)Stripe like artifact appearing on the case of narrow slit width can be removed by interpolation processing. (4) From the PSF (point spread function) calculated by Monte Carlo simulation, scatter rejection performance parameters were calculated.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.