Abstract
In this work, we evaluate the use of scanning Raman spectroscopy for characterizing long lengths of REBCO coated conductor tapes, as it can provide detailed insight into structure, composition, and local variations arising from defects or strain. We generate 2D maps of Raman wavelength and intensity features over extended 1 meter length of conductor and correlate them to the information collected by reel-to-reel (R2R) 2D X-Ray Diffraction (2D-XRD) and R2R Scanning Hall Probe Microscopy (SHPM). The three methods are compared in terms of depth of information, detectability of variation in features of interest and the potential for evaluating critical current performance over a range of fields and temperatures.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
