Abstract
The effect of argon (Ar+) ion beam treatment on the surface of polyethylene terephthalate (PET) samples was studied by scanning probe microscopy (SPM) and the changes in surface topography were assessed by atomic force microscopy (AFM). Kelvin probe force microscopy (KPFM) sheds light of adhesion force between treated polymer films and a Pt/Cr probe under dry conditions, obtaining the contact potential difference of material. As a result of Ar+ ion bombardment, important surface chemical changes were detected by X-ray photoelectron spectroscopy (XPS) measurements such as chains scission and incorporation of nitrogen species. Ion beam treatment increases the surface roughness from 0.49±0.1nm to 7.2±0.1nm and modify the surface potential of PET samples, decreasing the adhesive forces from 12.041±2.1nN to 5.782±0.06nN, and producing a slight increase in the electronic work function (Φe) from 5.1V (untreated) to 5.2V (treated). Ar+ ion beam treatment allows to potentially changing the surface properties of PET, modifying surface adhesion, improving surface chemical changes, wetting properties and surface potential of polymers.
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