Abstract
We have developed a scanning magneto-optical Kerr microscope dedicated to localization and measurement of the in-plane magnetization of ultra-thin layered magnetic nanostructures with high sensitivity and signal-to-noise ratio. The novel light detection scheme is based on a differential photodetector with automatic common mode noise rejection system with a high noise suppression up to 50 dB. The sensitivity of the developed detection scheme was tested by measurement of a single Co layer and a giant magnetoresistance (GMR) multilayer stack. The spatial resolution of the Kerr microscope was demonstrated by mapping an isolated 5×5 μm spin-valve pillar.
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