Abstract
Scan chains increase the testability but decrease security. Attackers may use scan chains to launch attacks to obtain sensitive information, which poses serious security threats. The scan chain-based attacks contain two steps: 1) scan data obtaining, including mode switching obtaining method and test mode only obtaining method, and 2) scan data analysis, including data mapping analysis method and signature analysis method. To prevent these attacks, various secure scan designs have been proposed. These designs are summarized into two categories: scan chain modification and scan input/output restriction. This paper gives a survey of the scan chain-based attacks and countermeasures. The secure scan designs are summarized and compared from the aspects of security, testability, test time, and hardware overhead.
Highlights
Testing is one of the most important steps in the Integrated Circuit (IC) manufacturing process to guarantee product quality
The attackers are prevented from inputting specific test data into the scan chain, and obtaining sensitive information by shifting out the intermediate encryption results stored in the scan chain
The design of Static Obfuscation of Scan Data (SOSD) improves the security of the scan chain, it may still suffer from test mode only based signature attack
Summary
Testing is one of the most important steps in the Integrated Circuit (IC) manufacturing process to guarantee product quality. 2) Adding modules such as cipher module or mask module before the scan in port and after the scan out port In this way, the attackers are prevented from inputting specific test data into the scan chain, and obtaining sensitive information by shifting out the intermediate encryption results stored in the scan chain. The design of SOSD improves the security of the scan chain, it may still suffer from test mode only based signature attack This is because once the scan cells are selected, the design will not change again, i.e. it is static. To achieve these benefits, the hardware overhead is large
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