Abstract
Scan test using scan chains is one of the most important DFT techniques. However, scan-based attacks are reported which can retrieve the secret key in crypto circuits by using scan chains. Secure scan architecture is strongly required to protect scan chains from scan-based attacks. This paper proposes an improved version of random order as a secure scan architecture. In improved random order, a scan chain is partitioned into multiple sub-chains. The structure of the scan chain changes dynamically by selecting a subchain to scan out. Testability and security of the proposed improved random order are also discussed in the paper, and the implementation results demonstrate the effectiveness of the proposed method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.