Abstract
An alternative simple method is proposed for analysing the scaling properties of thehigh-Tc superconductor cuprates. The temperature is rescaled with a parameterTR determined from theprecise analysis of RH(1/T), where RH is the Hall coefficient, in the high-temperature range. To illustrate thisnew method, the resistivity and Hall effect data obtained on underdopedYBa2Cu3Ox epitaxial thin films are analysed. It is shown that the temperature-dependent resistivityρ(T), Hall coefficientRH(T) and the cotangentof the Hall angle cot θH(T) of underdoped YBa2Cu3Ox can be scaled into universal curves using this parameterTR to make a linear transformation of temperature andρ(T),RH(T) orcotθH(T).
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