Abstract
Abstract This chapter discusses two procedures that assume a coherent pattern for the population trajectory of the crop pest over the growing season. These represent the two sides of sampling: sampling for classification and sampling for estimation. The first procedure is a method proposed by Pedigo and van Schaick (1984), which extends Wald's Sequential Probability Ratio Test into the time domain. The second procedure proposed by Plant and Wilson (1985) assumes that the increase of incidence levels can be described by an incidence growth curve whose shape is defined by two parameters. The method described derives from experience with spider mites (Tetranychus spp.) in cotton. Plant and Wilson were concerned about the potential for explosive population growth and damage of spider mites in cotton, following early pesticide use which could disrupt spider mite predators.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
