Abstract

Pattern images can be segmented in a template unit for efficient fabric vision inspection; however, segmentation criteria critically affect the segmentation and defect detection performance. To get the undistorted criteria for rotated images, rotation estimation of absolute angle needs to be proceeded. Given that conventional rotation estimations do not satisfy both rotation errors and computation times, patterned fabric defects are detected using manual visual methods. To solve these problems, this study proposes the application of segmentation reference point candidate (SRPC), generated based on a Euclidean distance map (EDM). SRPC is used to not only extract criteria points but also estimate rotation angle. The rotation angle is predicted using the orientation vector of SRPC instead of all pixels to reduce estimation times. SRPC-based image segmentation increases the robustness against the rotation angle and defects. The separation distance value for SRPC area distinction is calculated automatically. The performance of the proposed method is similar to state-of-the-art rotation estimation methods, with a suitable inspection time in actual operations for patterned fabric. The similarity between the segmented images is better than conventional methods. The proposed method extends the target of vision inspection on plane fabric to checked or striped pattern.

Highlights

  • IntroductionMost cameras used in machine vision support high-resolution image acquisiti

  • Most cameras used in machine vision support high-resolution image acquisitiMost camerasdefects used in machine support high-resolution acquisition to use bec detect detailed [1]

  • This paper described a method for appropriately segmenting fabric images with rotated or defective lattice and line patterns that can be used as a deep learning input data for machine vision inspection

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Summary

Introduction

Most cameras used in machine vision support high-resolution image acquisiti. Most camerasdefects used in machine support high-resolution acquisition to use bec detect detailed [1]. Thevision acquired images should beimage cropped before detect detailed defects [1]. The acquired images should be cropped before use because deep deep learning neural networks have limited input data sizes for low memory usage learning neural networks have limited input data sizes for low memory usage considering sidering the low spec of PC installed environments and preventing image loss [2]. Fi the low spec of PC installed environments and preventing image loss [2]. 1 showsofexamples of images machine vision camera. Examples images acquired usingacquired a machineusing visionacamera.

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