Abstract

Antiferromagnets produce no stray field, and therefore, a tip electrode made of antiferromagnetic material has been considered to be the most suitable choice to measure such as magnetoresistance (MR) through single isolated magnetic nanoparticles, molecules, and ultrathin films. Spin polarizations (P) of antiferromagnetic 3-nm, 6-nm, and annealed 3-nm Mn films grown on W tips with a bcc(110) apex as well as bulk-NiMn tips were obtained at 300 K by measuring MR in ultrahigh vacuum by means of spin-polarized scanning tunneling microscopy using a layerwise antiferromagnetically stacking bct-Mn(001) film electrode. The Mn-coated tips with coverages of 3 and 6 nm exhibited P values of 1 ± 1% and 3 ± 2%, respectively, which tips likely contain α- or strained Mn. With a thermal assist, the crystalline quality and the magnetic stability of the film could increase. The annealed tip exhibited P = 9 ± 2%. The bulk-NiMn tips exhibit spin polarizations of 0 or 6 ± 2% probably depending on the chemical species (Mn or Ni) present at the apex of the tip. Fe-coated W tips were used to estimate the bct-Mn(001) film spin polarization.

Highlights

  • a tip electrode made of antiferromagnetic material has been considered to be the

  • most suitable choice to measure such as magnetoresistance

  • 3-nm Mn films grown on W tips with a bcc(110

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Summary

Introduction

Antiferromagnets produce no stray field, and a tip electrode made of antiferromagnetic material has been considered to be the most suitable choice to measure such as magnetoresistance (MR) through single isolated magnetic nanoparticles, molecules, and ultrathin films.

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Conclusion
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