Abstract
The relationship between the grain boundary phase and insulation resistance of dielectric layers in multilayer ceramic capacitors (MLCs) was clarified, leading to a proposal for the mechanism of insulation resistance degradation. A Pb‐rich secondary phase was present at grain boundaries, and a small amount of Ag was detected from the secondary phase, while no secondary phase existed in dielectric layers with normal insulation resistance. These results suggest that diffusion from an internal electrode into the secondary phase in dielectric layers is responsible for the extremely low insulation resistance: oxygen vacancies, formed as a result of substitution of Ag for Pb, may play a role in lowering insulation resistance.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
