Abstract
We theoretically investigate the subgap transport in a ferromagnetic silicene/superconductor junction and highlight the role of the interface. It is demonstrated that the subgap conductance spectra for the continuous and discontinuous interface models are significantly different. In particular, the intravalley Andreev reflection (AR) may occur at the discontinuous interface, and then the subgap conductance will be remarkably enhanced when the silicene sheet is highly valley polarized. This novel AR resulted from the valley-mixing scattering, which is absent in the continuous interface model. The influence of the interface coupling strength on the subgap conductance is also computed. Our results can be directly tested experimentally using scanning tunnel microscope measurements and/or point-contact spectroscopy.
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