Abstract
Epitaxial thin films of cobalt ferrite (CFO) single layer and CFO–lead zirconium titanate (PZT) bilayers were deposited on single crystal MgO (1 0 0) and SrTiO3 (STO) (1 0 0) substrates by pulsed laser deposition. The structural properties were characterized using x-ray diffraction and atomic force microscopy. The magnetic properties of the as-grown thin films were measured at 10 and 300 K in both parallel and perpendicular magnetic fields. The CFO–PZT bilayer films showed enhanced or reduced values of magnetization as compared with those of the CFO single layer films depending on the substrate of deposition. A strain compression–relaxation mechanism was proposed in order to explain the structure–property relationships in the CFO–PZT bilayer thin films.
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