Role of Electron-Induced Coulomb Interactions to the Total SEU Rate During Earth and JUICE Missions

Abstract

The contribution of Coulomb processes induced by incident electrons in single event upset (SEU) sensitivity is investigated. The case of 65-nm silicon on insulator (SOI) memory is studied. Several orbits (GPS, Jupiter Icy Moons Explorer's (JUICE's) orbits) are analyzed. The relative importance to the total SEU rate of electron, proton, and gamma environments is compared. SEU induced by electrons is obtained during Earth missions. In the environment of Jupiter, equivalent SEU sensitivities have been obtained between the studied device and the European Space Agency (ESA) SEU monitor. However, the relative importance of the physical processes involved is very different. Proton-induced SEU rates are estimated about one decade greater than electron-induced SEU rates. The Bremsstrahlung contribution has been found negligible in such an environment.