Robustness Analysis of 3–2 Adder Compressor Designed in 7-nm FinFET Technology

Abstract

Adder compressors (ACs) have been employed for several prominent computing datapaths as multipliers, machine learning, discrete transforms, and filters. This brief investigates the robustness of the 3–2 AC against the process, voltage, and temperature (PVT) variability targeting a design for a predictive ASAP7 7nm FinFET technology. The variability impacts on the delay, power, and product-delay-power (PDP) of the 3–2 AC for both super- and near-threshold voltages operating regimes are herein evaluated. Our results demonstrate that process is the main concern among the variability issues for both operating regimes, presenting an even more alarming level of variability in near-threshold operation.