Abstract
A robust unbalanced Gires-Tournois interferometer (GTI) mirror for evaluating group delay dispersion (GDD) measurement by scanning white light interferometer is presented, and a novel processing algorithm based on scanning white light interferometer (WLI) is proposed to extract group delay and group delay dispersion characteristics with improved accuracy and low level of noise. The GDD measurement evaluation method is based on error analysis of manufacturing errors and spectral measurement. Spectral measurement is carried out to determine the resonance wavelength of GTI mirror. The sample was prepared by ion beam sputtering deposition. The relative errors of refractive index and layer thickness for the sample are estimated through reverse engineering based on multi-angle transmittance measurements. A novel processing algorithm the extrema searching method (ESM) is proposed that search the positions of multi-order extrema from reconstructed interferogram intensity to exact the GDD characteristics of the sample. GDD measurements performed by WLI with different processing methods are added to comparison including windowed Fourier transform, wavelet transform and time-domain scanning method. The results show that our method is reliable and effective for GDD measurement with a good accuracy and low level of noise.
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