Robust QCA full‐adders using an efficient fault‐tolerant five‐input majority gate

Abstract

SummaryQuantum‐dot cellular automata (QCA) is considered as a top candidate for nanoscale technologies with unique features such as very low occupancy and ultralow power consumption. Despite the potential benefits of QCA technology over CMOS technology, QCA circuits are highly prone to defects. Therefore, a demand has risen in designing fault‐tolerant circuits. In this research, a novel fault‐tolerant five‐input majority gate is first suggested, and then it is evaluated by implementing a variety of faults such as cell omission, cell displacement, and extra‐cell deposition. The evaluation results reveal that the proposed structure is 100%, 51.85%, and 18.8% fault‐tolerant under extra‐cell deposition, single‐cell omission, and double‐cell omission, respectively. Moreover, two single‐layer and coplanar fault‐tolerant QCA full‐adders are offered using the suggested fault‐tolerant structure. The stability of the presented single‐layer full‐adder has also been investigated under single and double cell omission defects. The evaluation outcomes show that the suggested fault‐tolerant single‐layer full‐adder has a high stability in Sum and Cout outputs compared with other full‐adders. In order to validate the functionality of the suggested fault‐tolerant five‐input majority gate, a number of physical investigations are given. The QCADesigner 2.0.3 software has been used to evaluate the simulation results.