Abstract

A rigorous spectral domain Green's function/Galerkin approach has been proposed by the authors (1988). It accurately models the effect of connecting a vertical probe feed to the patch. This approach is quite versatile and has been applied to a number of probe-fed patch geometries. A general description of this technique is given, and its application to a variety of microstrip patch geometries is discussed. Data generated by the numerical models are compared to measured data for both radiation and scattering cases. In particular, the measured input reflection coefficient of a probe-fed rectangular patch is compared to calculations made using both the rigorous solution described and the idealized probe feed model. >

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call