Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction

Luca Lutterotti, Sandro Ferrari + Show 3 more

https://doi.org/10.4028/www.scientific.net/msf.408-412.1603

Copy DOI

Journal: Materials Science Forum	Publication Date: Aug 20, 2002
Citations: 20

Abstract

Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction

Full Text

Published version (

Free)

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Paper Title

Journal

Date

Author

Paper Title

Journal

Date

Author