Review of 6T SRAM for Embedded Memory Applications

Abstract

Due to the substantial impact embedded Static Random Access Memory (SRAM)s have on the overall system and their relatively limited design, it is essential to manage embedded SRAM trade-offs strategically. SRAMs have power, performance and density trade-offs in general. In all applications, all three dimensions are necessary to some extent; accordingly, embedded SRAM design must incorporate the most crucial system-specific requirements when developing embedded SRAM. This paper discusses many SRAM factors, including Static Noise Margin (SNM), Read Access Time (RAT),Write Access Time (WAT), Read Stability and Write Ability, Power, Data Retention Voltage (DRV), and Process Control. All these factors are crucial when designing SRAM for embedded memory applications. There has also been a discussion of the parameter comparisons and the literature review of the current papers.