Abstract
Current noise in electronic devices usually arises from uncorrelated charging events, with discrete transitions resolved only at low temperatures. However, in nanotube-based field effect transistors (FETs), we have observed random telegraph signal (RTS) with unprecedented amplitude at room temperature. This RTS is characteristically truncated, suggesting that the current blockade induced by one trap fully reverses through electrostatic interaction with another. These observations have motivated us to develop a robust quantum transport model that reveals how the fast varying, logarithmic gate potential along a one-dimensional channel makes it possible to detect correlated transitions arising from multiple charge traps. These results suggest applications including adsorbate detection and spectroscopy and the development of strategies to passivate traps and mitigate current noise in FETs.
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