Retraction: “Dependence of structural and optical properties of In0.23Ga0.77As/GaAs quantum wells on misfit dislocations: Different critical thickness for dislocation generation and degradation of optical properties” [J. Vac. Sci. Technol. B 8, 751–757 (1990)

M Grundmann,A Fischer-Colbrie,U Lienert,D Bimberg,J N Miller,J Christen

doi:10.1116/6.0003220

Retraction: “Dependence of structural and optical properties of In0.23Ga0.77As/GaAs quantum wells on misfit dislocations: Different critical thickness for dislocation generation and degradation of optical properties” [J. Vac. Sci. Technol. B 8, 751–757 (1990)

M Grundmann, A Fischer-Colbrie + Show 4 more

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https://doi.org/10.1116/6.0003220

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Journal: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Publication Date: Nov 20, 2023

Affiliation: Technische Universität Berlin, Hewlett-Packard (United States)

#Optical Properties Of In0 #Degradation Of Optical Properties + Show 7 more

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Retraction: “Dependence of structural and optical properties of In0.23Ga0.77As/GaAs quantum wells on misfit dislocations: Different critical thickness for dislocation generation and degradation of optical properties” [J. Vac. Sci. Technol. B <b>8</b>, 751–757 (1990)

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