Abstract
Aqueous iron (III) oxide nanoparticles were irradiated with pure self-amplified spontaneous emission (SASE) X-ray free-electron laser (XFEL) pulses tuned to the energy around the Fe K-edge ionization threshold. For each XFEL shot, the incident X-ray pulse spectrum and Fe Kβ emission spectrum were measured synchronously with dedicated spectrometers and processed through a reconstruction algorithm allowing for the determination of Fe Kβ resonant X-ray emission spectroscopy (RXES) plane with high energy resolution. The influence of the number of X-ray shots employed in the experiment on the reconstructed data quality was evaluated, enabling the determination of thresholds for good data acquisition and experimental times essential for practical usage of scarce XFEL beam times.
Highlights
The unique combination of high-brilliance and ultra-short pulses delivered by Xray free electron lasers (XFELs) has opened up new possibilities for studying complex phenomena in physics [1], chemistry [2,3], biology [4,5], material science [6], as well as many other disciplines
For each XFEL shot, the incident X-ray pulse spectrum and Fe Kβ emission spectrum were measured synchronously with dedicated spectrometers and processed through a reconstruction algorithm allowing for the determination of Fe Kβ resonant X-ray emission spectroscopy (RXES) plane with high energy resolution
It has been shown that the combination of the stochastic nature of spontaneous emission (SASE) pulses with non-invasive diagnostics can be used to extend the scope of X-ray spectroscopies at XFELs to two-dimensional X-ray spectroscopy techniques, i.e., resonant X-ray emission spectroscopy (RXES)
Summary
The unique combination of high-brilliance and ultra-short pulses delivered by Xray free electron lasers (XFELs) has opened up new possibilities for studying complex phenomena in physics [1], chemistry [2,3], biology [4,5], material science [6], as well as many other disciplines. Abstract: Aqueous iron (III) oxide nanoparticles were irradiated with pure self-amplified spontaneous emission (SASE) X-ray free-electron laser (XFEL) pulses tuned to the energy around the Fe K-edge ionization threshold.
Sign-in/Register to view highlights & summary 
Published Version (
Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call