Abstract
Most advanced applications of polymers rely on heterogeneous structures or specific interfacial properties to yield desired performance and functionalities. Rational design and application require that these structures be characterized. Recently, it has been demonstrated that soft x-ray scattering is a unique complementary technique to conventional hard x-ray and neutron scattering and an excellent tool for polymer structure determination with improved chemical sensitivity. Efforts to enhance the capabilities and efficiency of soft x-ray scattering through the use of a CCD detector will be delineated and first results presented. Development of a dedicated setup at beamline 11.0.1.2 of the Advanced Light Source will be described. This set-up has an elliptically polarized undulator as a source, which offers complete polarization control and hence unique capabilities.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IOP Conference Series: Materials Science and Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
