Resonant elastic scattering of light from single quantum wells in semiconductor multilayers

Abstract

A theory is developed for steady-state elastic scattering of light via quasi-2D excitons from a quantum well (QW) whose interfaces are randomly rough. The study is mainly focused on the angle dependences of radiation giving direct information about static disorder responsible for the elastic scattering. A nonlocal excitonic susceptibility is expressed in terms of random profile functions of QW interfaces. Treated is elastic scattering of light from a disordered QW in the following actual dielectric environments: (i) a uniform background, (ii) a Fabry–Perot film with rough boundaries, and (iii) a semiconductor microcavity. The cross-sections are derived analytically for scattering of linearly polarized light to the lowest (Born's) approximation with arbitrary roughness statistics. The spectral and angle dependencies of scattering intensity are analyzed numerically in the absolute-value scale with Gaussian correlation of interface roughness. The probability ∼10 −2 was found for the exciton-mediated scattering of a photon from a QW interface roughness whose root-mean-square height is on the level of 2×10 −1 nm . This probability is shown to exceed by two orders of magnitude that is typical of resonant scattering from either a single semiconductor surface or rough boundaries of a semiconductor Fabry–Perot film containing the QW. The scattering spectrum of a QW placed in a microcavity is predicted to have a doublet structure whose components are associated with the cavity exciton–polaritons.