Abstract
A quantitative relationship has been experimentally determined correlation the resolution degradation of p-type coaxial high-purity germanium detectors to the concentration of residual hole-trapping point defects. Detector diameters ranged from 48 to 65 mm, and the average electric-field strength was 1500 V/cm. The concept of a ‘‘standard level’’ is proposed, which originates in the similar capture kinetics of many commonly observed residual acceptors in high-purity germanium. A method for calculating the electric-field dependence of hole capture is presented and used to compare the data reported here with published modeling results parameterized by the mean-free-drift length. Good general agreement is found.
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