Abstract
Resistor geometry comparison with respect to current noise and trim sensitivity : W. Ulbrich. Electrocomp. Sci. Technol.4, 63 (1977)
Highlights
The paper deals with laser trimming of film resistors
The boundary conditions are either ideal conductivity at terminations or zero conductivity (o 0) at the other borders including the edges of trim cuts with a narrow kerf
-The current noise voltage U2 of a resistor has been shown by Kuo and Blank2 to be strongly dependent on geometry" U U k/Fe where k is a material constant and Fe is the effective area of the film resistor
Summary
The approach used for the computer simulation is based on the over-relaxation method for solving finite-difference equations. An orthogonal set of n equidistant current flow lines k const, is constructed. Both sets of lines together dissect the resistor area in n2 sub resistors with the same resistance Ruu= R (= 2R, R/2 at the borders) as shown, for example. Such a plot is a good qualitative indication for hotspots or unused subareas. -The current noise voltage U2 of a resistor has been shown by Kuo and Blank to be strongly dependent on geometry" U U k/Fe where k is a material constant and Fe is the effective area of the film resistor. Fuu subresisto___rs Rgu with individual subareas as noise sources U 1/F, as shown on the right of Figure
Sign-in/Register to view highlights & summary 
Submitted Version (
Free)
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call