Abstract
Although bulk magnetic properties of various antiferromagnets have been vigorously studied since long ago, their properties in the form of thin films, which are more relevant to antiferromagnetic spintronic devices, have not been investigated as much. In this work, we characterized the Néel temperature of Cr2O3 thin films by investigating the temperature dependence of the spin Hall magnetoresistance in Cr2O3/Pt bilayers. A precise determination of the Néel temperature was made possible by carefully designing the direction of the magnetic anisotropy in Cr2O3. The results provide a reliable way to determine the Néel temperature of antiferromagnetic thin films.
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